Pattern Inspection Model
A system that simultaneously measures the pattern dimensions of coated and uncoated areas
and inspects both areas for defects.
With high-speed cameras and a high-speed image processing board,
it delivers higher-precision measurement and inspection than conventional models.




Defect detection levels can be set for each measurement section.
In addition to coated and uncoated areas,
corner drop-off, waviness, front/back misalignment and more can be measured.

Equipped with a wide range of processing functions,
including shading correction for unevenness and noise, filter functions,
and vertical streak inspection using streak enhancement.

NireCla automatically sorts the defects detected by Mujiken into types with AI image classification.